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Electronics and Electrical Engineering | The University of Edinburgh |
ICMTS
- International Conference on Microelectronic Test Structures
DFT
- IEEE Workshop on Defect and Fault Tolerance
- International Workshop on Statistical Metrology - in association with
the 1998 Symposium on VLSI Technology (June 1998)
ESSDERC
- European Solid State DEvices Research Conference
DAC
- Design Automation Conference
ACM/SIGDA
Physical Design Workshop
IRPS
International Reliability Physics Symposium
Other conference information
maintained by CEM at UMIST
IEEE
Electron Devices conference information
TCAD
conference information
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Revision Date: 1st Feb 1999
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